VEOS
Featuring cutting-edge detector technology on the basis of semiconductor detectors that were specially developed for emission spectroscopy, OBLF’s VeOS spark emission spectrometer enables versatile, flexible and quick analysis of all common metallic materials. The analytical spectrum also includes the precise analysis of short wavelength elements like nitrogen or low carbon.
Benefits
- Complete and flexible inclusion of all analytical tasks
- Easily extendable features
- The latest, specially developed detector technology
- Excellent performance with regard to detection limit, precision, stability
- Robust design for use in heavy-duty environments
- Most comprehensive multi-matrix application options without any restrictions
regarding the selection of elements for analysis - Accurate detection of N and traces of carbon (ULC)